Makale
Tam Makale
Uluslararası
2017
The Stability of Electrical Characteristics of Ti/n-Si/Ag, Ti/n-Si/Cu and Ti/n-Si/AgCu Diodes Prepared Under the Same Conditions With Respect to Increasing Aging Time
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Cilt 68 · ss. 186–192 · 01.06.2017
Atıf için künye
TAŞER, A., Güzeldir, B., & SAĞLAM, M. (2017). The Stability of Electrical Characteristics of Ti/n-Si/Ag, Ti/n-Si/Cu and Ti/n-Si/AgCu Diodes Prepared Under the Same Conditions With Respect to Increasing Aging Time. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 68, 186–192.
BibTeX
@article{taser2017-65781,
author = {TAŞER, Ahmet and Güzeldir, Betül and SAĞLAM, Mustafa},
title = {The Stability of Electrical Characteristics of Ti/n-Si/Ag, Ti/n-Si/Cu and Ti/n-Si/AgCu Diodes Prepared Under the Same Conditions With Respect to Increasing Aging Time},
journal = {MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING},
year = {2017},
volume = {68},
pages = {186--192},
issn = {1369-8001},
url = {https://akademik.atauni.edu.tr/yayinlar/65781-the-stability-of-electrical-characteristics-of-tin-siag-tin-sicu-and-tin-siagcu}
}