Makale
Tam Makale
Ulusal
2016
Structural Characterization of InSe:Zn Binary Semiconductor Grown By Bridgman/Stockbarger Technique THALES International Journal of Thales Engineering Sciences (Jthes) Issn (Online): 2149-5297 18-28, 2016.
International Journal of Thales Engineering Sciences (Jthes)
01.09.2016
Atıf için künye
Gürbulak, B., ASHKHASİ, A., ŞATA, M., ÖZÇELİK, Ş., & DUMAN, S. (2016). Structural Characterization of InSe:Zn Binary Semiconductor Grown By Bridgman/Stockbarger Technique THALES International Journal of Thales Engineering Sciences (Jthes) Issn (Online): 2149-5297 18-28, 2016. International Journal of Thales Engineering Sciences (Jthes).
BibTeX
@article{gurbulak2016-65479,
author = {Gürbulak, Bekir and ASHKHASİ, Afsoun and ŞATA, MEHMET and ÖZÇELİK, ŞEYMA and DUMAN, SONGÜL},
title = {Structural Characterization of InSe:Zn Binary Semiconductor Grown By Bridgman/Stockbarger Technique THALES International Journal of Thales Engineering Sciences (Jthes) Issn (Online): 2149-5297 18-28, 2016.},
journal = {International Journal of Thales Engineering Sciences (Jthes)},
year = {2016},
url = {https://akademik.atauni.edu.tr/yayinlar/65479-structural-characterization-of-insezn-binary-semiconductor-grown-by}
}