Bildiri
Uluslararası
2015
Electrical Characterization of Au Fe3O4 p Si Al Rectifier Devices Depending on X Ray Radiation Dos
International Semiconductor Science and Technology Conference 2015.
11.05.2015–13.05.2015 · 11.05.2015
Atıf için künye
DENİZ, A. R., ÇALDIRAN, Z., ŞAHİN, Y., HATİCE, K., ŞİNOFOROĞLU, M., & Aydoğan, Ş. (2015). Electrical Characterization of Au Fe3O4 p Si Al Rectifier Devices Depending on X Ray Radiation Dos. International Semiconductor Science and Technology Conference 2015.
BibTeX
@inproceedings{deniz2015-65007,
author = {DENİZ, ALİ RIZA and ÇALDIRAN, ZAKİR and ŞAHİN, YILMAZ and HATİCE, KAÇUŞ and ŞİNOFOROĞLU, MEHMET and Aydoğan, Şakir},
title = {Electrical Characterization of Au Fe3O4 p Si Al Rectifier Devices Depending on X Ray Radiation Dos},
booktitle = {International Semiconductor Science and Technology Conference 2015.},
year = {2015},
url = {https://akademik.atauni.edu.tr/yayinlar/65007-electrical-characterization-of-au-fe3o4-p-si-al-rectifier-devices-depending-on-x}
}