Electrochemical impedance spectroscopy analysis of ZnO films: the effect of Mg doping

Pure and Mg-doped ZnO films have been successfully grown on indium-doped tin oxide (ITO) substrates by simple chemical spray pyrolysis and their crystallographic properties characterised using X-ray diffraction (XRD) measurements in the range . The XRD measurements revealed that all samples have a hexagonal wurtzite crystal structure and a polycrystalline nature. The structural parameters of the samples were evaluated as a function of Mg content. The electrical properties of the films were evaluated using electrochemical impedance spectroscopy measurements. The circuit parameters were obtained by an equivalent circuit model presuming certain corrosion features of the synthesised films. Additionally, open-circuit potentials and the Bode approximation were used to create a correlation between structural changes resulting from Mg content addition and the variation in the corrosion behaviour of the films.