Bildiri
Tam Metin Bildiri
Uluslararası
1992
PERSISTENT PHOTO HALL PHENOMENON AND NEAR BAND EDGE ABSORPTION IN LIGHTLY N TYPE LEC GAAS, MATERIALS RESEARCH SOCIETY
MATERIALS RESEARCH SOCIETY , Defect Engineering in Semiconductor Growth, Processing, and Device Technology
ss. 99–105 · San Francisco · 15.05.1992–19.05.1992 · 15.05.1992
Atıf için künye
Tüzemen, S., & BROZEL, M. (1992). PERSISTENT PHOTO HALL PHENOMENON AND NEAR BAND EDGE ABSORPTION IN LIGHTLY N TYPE LEC GAAS, MATERIALS RESEARCH SOCIETY. MATERIALS RESEARCH SOCIETY , Defect Engineering in Semiconductor Growth, Processing, and Device Technology, San Francisco (ss. 99–105).
BibTeX
@inproceedings{tuzemen1992-64724,
author = {Tüzemen, Sebahattin and BROZEL, MR},
title = {PERSISTENT PHOTO HALL PHENOMENON AND NEAR BAND EDGE ABSORPTION IN LIGHTLY N TYPE LEC GAAS, MATERIALS RESEARCH SOCIETY},
booktitle = {MATERIALS RESEARCH SOCIETY , Defect Engineering in Semiconductor Growth, Processing, and Device Technology},
address = {San Francisco},
year = {1992},
pages = {99--105},
url = {https://akademik.atauni.edu.tr/yayinlar/64724-persistent-photo-hall-phenomenon-and-near-band-edge-absorption-in-lightly-n-type}
}