Analysis of IR absorption mapping of defects in liquid-encapsulated Czochralski GaAs

Brozel, M.R.; Tüzemen, Sebahattin

doi:10.1016/0921-5107(94)90031-0

Makale Tam Makale Uluslararası 1994

Analysis of IR absorption mapping of defects in liquid-encapsulated Czochralski GaAs

M.R. Brozel, Sebahattin Tüzemen

MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS Cilt 28 · ss. 130–133 · 01.01.1994

DOI ile aç

Atıf için künye

Brozel, M., & Tüzemen, S. (1994). Analysis of IR absorption mapping of defects in liquid-encapsulated Czochralski GaAs. MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS, 28, 130–133. https://doi.org/10.1016/0921-5107%2894%2990031-0

BibTeX

@article{brozel1994-64670,
  author = {Brozel, M.R. and Tüzemen, Sebahattin},
  title = {Analysis of IR absorption mapping of defects in liquid-encapsulated Czochralski GaAs},
  journal = {MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS},
  year = {1994},
  volume = {28},
  pages = {130--133},
  issn = {0921-5107},
  doi = {10.1016/0921-5107(94)90031-0},
  url = {https://akademik.atauni.edu.tr/yayinlar/64670-analysis-of-ir-absorption-mapping-of-defects-in-liquid-encapsulated-czochralski}
}