Bildiri
Poster
Uluslararası
2016
The Effects Of Sample Temperature And Thermal Annealing On Characteristic Parameters Of Au n InP In Schottky Diodes Determined From Current Voltage Measurements
International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY.
25.02.2016–27.02.2016 · 25.02.2016
Atıf için künye
CİMİLLİ ÇATIR, F. E., Sağlam, M., & Türüt, A. (2016). The Effects Of Sample Temperature And Thermal Annealing On Characteristic Parameters Of Au n InP In Schottky Diodes Determined From Current Voltage Measurements. International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY.
BibTeX
@inproceedings{cimillicatir2016-64382,
author = {CİMİLLİ ÇATIR, FULYA ESRA and Sağlam, Mustafa and Türüt, Abdülmecit},
title = {The Effects Of Sample Temperature And Thermal Annealing On Characteristic Parameters Of Au n InP In Schottky Diodes Determined From Current Voltage Measurements},
booktitle = {International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY.},
year = {2016},
url = {https://akademik.atauni.edu.tr/yayinlar/64382-the-effects-of-sample-temperature-and-thermal-annealing-on-characteristic}
}