Bildiri
Özet Bildiri
Uluslararası
2016
F. E. CİMİLLİ ÇATIR, M. SAĞLAM and A. TÜRÜT, The Effects Of Sample Temperature And Thermal Annealing On Characteristic Parameters Of Au/n-InP/In Schottky Diodes Determined From Current-Voltage Measurements
International Physics Conference At The Anatolian Peak (IPCAP 2016)
ss. 452 · Erzurum · 25.02.2016–27.02.2016 · 25.02.2016
Atıf için künye
Sağlam, M. (2016). F. E. CİMİLLİ ÇATIR, M. SAĞLAM and A. TÜRÜT, The Effects Of Sample Temperature And Thermal Annealing On Characteristic Parameters Of Au/n-InP/In Schottky Diodes Determined From Current-Voltage Measurements. International Physics Conference At The Anatolian Peak (IPCAP 2016), Erzurum (ss. 452).
BibTeX
@inproceedings{saglam2016-64375,
author = {Sağlam, Mustafa},
title = {F. E. CİMİLLİ ÇATIR, M. SAĞLAM and A. TÜRÜT, The Effects Of Sample Temperature And Thermal Annealing On Characteristic Parameters Of Au/n-InP/In Schottky Diodes Determined From Current-Voltage Measurements},
booktitle = {International Physics Conference At The Anatolian Peak (IPCAP 2016)},
address = {Erzurum},
year = {2016},
pages = {452},
url = {https://akademik.atauni.edu.tr/yayinlar/64375-f-e-cimilli-catir-m-saglam-and-a-turut-the-effects-of-sample-temperature-and}
}