Bildiri
Tam Metin Bildiri
Uluslararası
2019
EFFECTS OF THERMAL ANNEALING ON DIODE PARAMETERS FROM C-V MEASUREMENTS OF THE Cd/CdS/n-GaAs/In AND Cd/CdSe/n-GaAs/In STRUCTURES
MAS INTERNATIONAL CONFERENCE ON MATHEMATICS-ENGINEERING-NATURAL&MEDICAL SCIENCES-V, Erzurum, Türkiye
ss. 622 · Erzurum · 02.05.2019–05.05.2019 · 02.05.2019
Atıf için künye
Yıldırım, F., Orhan, Z., Güzeldir, B., & Sağlam, M. (2019). EFFECTS OF THERMAL ANNEALING ON DIODE PARAMETERS FROM C-V MEASUREMENTS OF THE Cd/CdS/n-GaAs/In AND Cd/CdSe/n-GaAs/In STRUCTURES. MAS INTERNATIONAL CONFERENCE ON MATHEMATICS-ENGINEERING-NATURAL&MEDICAL SCIENCES-V, Erzurum, Türkiye, Erzurum (ss. 622).
BibTeX
@inproceedings{yildirim2019-64334,
author = {Yıldırım, Fatma and Orhan, Zeynep and Güzeldir, Betül and Sağlam, Mustafa},
title = {EFFECTS OF THERMAL ANNEALING ON DIODE PARAMETERS FROM C-V MEASUREMENTS OF THE Cd/CdS/n-GaAs/In AND Cd/CdSe/n-GaAs/In STRUCTURES},
booktitle = {MAS INTERNATIONAL CONFERENCE ON MATHEMATICS-ENGINEERING-NATURAL&MEDICAL SCIENCES-V, Erzurum, Türkiye},
address = {Erzurum},
year = {2019},
pages = {622},
url = {https://akademik.atauni.edu.tr/yayinlar/64334-effects-of-thermal-annealing-on-diode-parameters-from-c-v-measurements-of-the}
}