Bildiri
Poster
Uluslararası
2016
The Effect Of Annealing On The Electrical Characterization Of Cu n Type InP Schottky Diodes C V Measurements As A Function Of Sample Tempertature
International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY.
25.02.2016–27.02.2016 · 25.02.2016
Atıf için künye
CİMİLLİ ÇATIR, F. E., Sağlam, M., & Abdülmecit, T. (2016). The Effect Of Annealing On The Electrical Characterization Of Cu n Type InP Schottky Diodes C V Measurements As A Function Of Sample Tempertature. International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY.
BibTeX
@inproceedings{cimillicatir2016-64330,
author = {CİMİLLİ ÇATIR, FULYA ESRA and Sağlam, Mustafa and Abdülmecit, Türüt},
title = {The Effect Of Annealing On The Electrical Characterization Of Cu n Type InP Schottky Diodes C V Measurements As A Function Of Sample Tempertature},
booktitle = {International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY.},
year = {2016},
url = {https://akademik.atauni.edu.tr/yayinlar/64330-the-effect-of-annealing-on-the-electrical-characterization-of-cu-n-type-inp}
}