Bildiri
Tam Metin Bildiri
Uluslararası
2011
Chracteristic parameters of CdS thin film and C-V properties of Cd/CdS/GaAs/ln sandiwich structure as a function of frequency grown by SILAR Method
World Congress on Engineering and Technology (CET)
ss. 17–20 · Shangai · 28.10.2011–02.11.2011 · 28.10.2011
Atıf için künye
Ateş, A., Güzeldir, B., Sağlam, M., & DURAK, R. (2011). Chracteristic parameters of CdS thin film and C-V properties of Cd/CdS/GaAs/ln sandiwich structure as a function of frequency grown by SILAR Method. World Congress on Engineering and Technology (CET), Shangai (ss. 17–20).
BibTeX
@inproceedings{ates2011-64319,
author = {Ateş, Aytünç and Güzeldir, Betül and Sağlam, Mustafa and DURAK, Rıdvan},
title = {Chracteristic parameters of CdS thin film and C-V properties of Cd/CdS/GaAs/ln sandiwich structure as a function of frequency grown by SILAR Method},
booktitle = {World Congress on Engineering and Technology (CET)},
address = {Shangai},
year = {2011},
pages = {17--20},
url = {https://akademik.atauni.edu.tr/yayinlar/64319-chracteristic-parameters-of-cds-thin-film-and-c-v-properties-of-cdcdsgaasln}
}