Bildiri
Tam Metin Bildiri
Uluslararası
2019
Determination of the Structural Properties of NiCr2O4 and Ti Dopped NiCr2O4 Thin Films Grown byRadio Frequency Sputtering Technique (RF) and Gas Sensor Application
3rd International Conference on AdvancedEngineering Technologies
ss. 1226–1229 · Bayburt · 19.09.2019–21.09.2019 · 19.09.2019
Atıf için künye
Turgut, E., Sarıtaş, S., Yıldırım, M., & GÜR, E. (2019). Determination of the Structural Properties of NiCr2O4 and Ti Dopped NiCr2O4 Thin Films Grown byRadio Frequency Sputtering Technique (RF) and Gas Sensor Application. 3rd International Conference on AdvancedEngineering Technologies, Bayburt (ss. 1226–1229).
BibTeX
@inproceedings{turgut2019-64064,
author = {Turgut, Erdal and Sarıtaş, Sevda and Yıldırım, Muhammet and GÜR, EMRE},
title = {Determination of the Structural Properties of NiCr2O4 and Ti Dopped NiCr2O4 Thin Films Grown byRadio Frequency Sputtering Technique (RF) and Gas Sensor Application},
booktitle = {3rd International Conference on AdvancedEngineering Technologies},
address = {Bayburt},
year = {2019},
pages = {1226--1229},
url = {https://akademik.atauni.edu.tr/yayinlar/64064-determination-of-the-structural-properties-of-nicr2o4-and-ti-dopped-nicr2o4-thin}
}