Bildiri
Poster
Uluslararası
2018
Investigation of Surface Topography of GaTe and GaTe:CdSemiconductors using Atomic Force Microscopy
the International Conference onPhysical Chemistry and Functional Materials(PCFM’18)EditorsNiyazi Bulut, PhDPublished, June
19.06.2018–21.06.2018 · 19.06.2018
Atıf için künye
ŞATA, M., karataş, S., Erzeneoğlu, S. Z., TURGUT, G., & Gürbulak, B. (2018). Investigation of Surface Topography of GaTe and GaTe:CdSemiconductors using Atomic Force Microscopy. the International Conference onPhysical Chemistry and Functional Materials(PCFM’18)EditorsNiyazi Bulut, PhDPublished, June.
BibTeX
@inproceedings{sata2018-63496,
author = {ŞATA, MEHMET and karataş, sevda and Erzeneoğlu, Salih Zeki and TURGUT, GÜVEN and Gürbulak, Bekir},
title = {Investigation of Surface Topography of GaTe and GaTe:CdSemiconductors using Atomic Force Microscopy},
booktitle = {the International Conference onPhysical Chemistry and Functional Materials(PCFM’18)EditorsNiyazi Bulut, PhDPublished, June},
year = {2018},
url = {https://akademik.atauni.edu.tr/yayinlar/63496-investigation-of-surface-topography-of-gate-and-gatecdsemiconductors-using}
}