Determination of the coating thicknesses due to the scattered radiation in energy dispersive X-ray fluorescence spectrometry

Ekinci, Neslihan; Kurucu, Yakup; ÖZ, Emel; ŞAHİN, Yılmaz

doi:10.1016/s1350-4487(02)00048-3

Makale Tam Makale Uluslararası 2002

Determination of the coating thicknesses due to the scattered radiation in energy dispersive X-ray fluorescence spectrometry

Neslihan Ekinci, Yakup Kurucu, Emel ÖZ, Yılmaz ŞAHİN

Radiation Measurements Cilt 35 · Sayı 3 · ss. 223–227 · 23.05.2002

DOI ile aç

Anahtar kelimeler

EXCITATION coating thickness self-absorption correction mass absorption coefficient SAMPLE THICKNESS MASS THICKNESS SECTIONS

Atıf için künye

Ekinci, N., Kurucu, Y., ÖZ, E., & ŞAHİN, Y. (2002). Determination of the coating thicknesses due to the scattered radiation in energy dispersive X-ray fluorescence spectrometry. Radiation Measurements, 35(3), 223–227. https://doi.org/10.1016/s1350-4487%2802%2900048-3

BibTeX

@article{ekinci2002-63327,
  author = {Ekinci, Neslihan and Kurucu, Yakup and ÖZ, Emel and ŞAHİN, Yılmaz},
  title = {Determination of the coating thicknesses due to the scattered radiation in energy dispersive X-ray fluorescence spectrometry},
  journal = {Radiation Measurements},
  year = {2002},
  volume = {35},
  number = {3},
  pages = {223--227},
  issn = {1350-4487},
  doi = {10.1016/s1350-4487(02)00048-3},
  url = {https://akademik.atauni.edu.tr/yayinlar/63327-determination-of-the-coating-thicknesses-due-to-the-scattered-radiation-in}
}