Angular dependence of L X-ray differential cross-section for In, Sn, Sb, and Te at 5.96 keV

Demir, Lütfü; Sahin, M; Sahin, Y

doi:10.1081/tma-120025810

Makale Tam Makale Uluslararası 2003

Angular dependence of L X-ray differential cross-section for In, Sn, Sb, and Te at 5.96 keV

Lütfü Demir, M Sahin, Y Sahin

JOURNAL OF TRACE AND MICROPROBE TECHNIQUES Cilt 21 · Sayı 4 · ss. 593–599 · 01.01.2003

DOI ile aç

Özet

The differential cross-sections of L X-ray induced in In, Sn, Sb, and Te have been measured at different angles from 94degrees to 170degrees at intervals of 9degrees. Measurement have been performed with a Si(Li) detector using 5.96 keV photons as the excitation source. It is seen from the results concerning heavy elements that Lalpha peaks show anisotropic emissionn while Lbeta and Lgamma peaks are emitted isotropically.

Atıf için künye

Demir, L., Sahin, M., & Sahin, Y. (2003). Angular dependence of L X-ray differential cross-section for In, Sn, Sb, and Te at 5.96 keV. JOURNAL OF TRACE AND MICROPROBE TECHNIQUES, 21(4), 593–599. https://doi.org/10.1081/tma-120025810

BibTeX

@article{demir2003-63197,
  author = {Demir, Lütfü and Sahin, M and Sahin, Y},
  title = {Angular dependence of L X-ray differential cross-section for In, Sn, Sb, and Te at 5.96 keV},
  journal = {JOURNAL OF TRACE AND MICROPROBE TECHNIQUES},
  year = {2003},
  volume = {21},
  number = {4},
  pages = {593--599},
  issn = {0733-4680},
  doi = {10.1081/tma-120025810},
  url = {https://akademik.atauni.edu.tr/yayinlar/63197-angular-dependence-of-l-x-ray-differential-cross-section-for-in-sn-sb-and-te-at}
}