Exploration of the dependence of scattering intensity ratios on albedo parameters

In XRF, intensity ratios (characteristic or scattering) are data sets in which experimental errors are minimized. It reduces the need for parameters such as the geometry factor, detector efficiency used in the calculation of fluorescence parameters. In this study, we aimed to analyze qualitatively of complex materials by examining the dependence of Compton and Rayleigh scattering intensity ratios on albedo parameters. The targets were prepared using the dilution method. 241Am radioactive source was used to excite the samples. The scattered x-rays from samples were collected by a HPGe detector. The calibration curves were performed from the IComp./IComp.background, IRayl./IComp.background, (IRayl.+IComp.)/(μ/ρ)Rayl. and IRayl./IComp. ratios versus effective atomic number and albedo number. The calibration curves with high correlation coefficients between intensity ratios, albedo and effective atomic numbers were obtained. The albedo numbers of the Sample no:1 and Sample no:13 in the prepared standard set are obtained as 0.418 and 0.023, respectively. The calibration equations obtained in this study enable qualitative analysis and the estimation of albedo (reflection) numbers.