X- and gamma-ray irradiation effects on vanadium pentoxide thin films
Özet
Thickness and composition of thin films can be measured with X- and gamma-rays. In this work, thickness and composition of vanadium pentoxide thin films are investigated by energy dispersive and wavelength dispersive X-ray fluorescence systems. Also, the surface analysis of vanadium pentoxide thin films irradiated with Rhodium K X-rays and 59.54keV gamma-rays emitted from 100mCi and 5Ci Americium-241 radioactive sources is performed by scanning electron microscope. It is observed that X- and gamma-rays are destructive for vanadium pentoxide thin films. Also, the composition of vanadium pentoxide thin films changes by irradiation with X- and gamma-rays.
Sürdürülebilir Kalkınma Amaçları
-
SKA 7: Erişilebilir ve Temiz Enerji
Atıf için künye
Yılmaz, D., Güzeldir, B., AKKUŞ, T., & ÖZNÜLÜER, T. (2018). X- and gamma-ray irradiation effects on vanadium pentoxide thin films. SPECTROSCOPY LETTERS, 51(6), 297–301. https://doi.org/10.1080/00387010.2018.1475397
BibTeX
@article{yilmaz2018-62872,
author = {Yılmaz, Demet and Güzeldir, Betül and AKKUŞ, TUBA and ÖZNÜLÜER, Tuba},
title = {X- and gamma-ray irradiation effects on vanadium pentoxide thin films},
journal = {SPECTROSCOPY LETTERS},
year = {2018},
volume = {51},
number = {6},
pages = {297--301},
issn = {0038-7010},
doi = {10.1080/00387010.2018.1475397},
url = {https://akademik.atauni.edu.tr/yayinlar/62872-x-and-gamma-ray-irradiation-effects-on-vanadium-pentoxide-thin-films}
}