Improved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurements
Özet
A new deembedding technique is proposed for relative complex permittivity epsilon(r) determination of dielectric materials using gated free-space measurements. Its three main features are 1) it does not require any formal calibration procedure (calibration-free); 2) it is position-insensitive; and 3) it extracts ripple-free epsilon(r) due to gating process. The objective function derived to determine epsilon(r) by the proposed method is validated by free-space measurements of three dielectric samples (polypropylene, polyethylene, and polyoxymethylene). Besides, the accuracy of our method is compared with the accuracy of other calibrationfree and calibration-dependent methods in the literature.
Anahtar kelimeler
Atıf için künye
HASAR, U. C., KAYA, Y., Kaya, Y., Izginli, M., ERTUĞRUL, M., Barroso, J. J., & Ramahi, O. M. (2022). Improved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurements. IEEE Transactions on Instrumentation and Measurement, 71. https://doi.org/10.1109/tim.2022.3153991
BibTeX
@article{hasar2022-200521,
author = {HASAR, UĞUR CEM and KAYA, YUNUS and Kaya, Yunus and Izginli, Mucahit and ERTUĞRUL, Mehmet and Barroso, Joaquim Jose and Ramahi, Omar M.},
title = {Improved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurements},
journal = {IEEE Transactions on Instrumentation and Measurement},
year = {2022},
volume = {71},
issn = {0018-9456},
doi = {10.1109/tim.2022.3153991},
url = {https://akademik.atauni.edu.tr/yayinlar/200521-improved-method-for-permittivity-determination-of-dielectric-samples-by-free}
}