Two-step numerical procedure for complex permittivity retrieval of dielectric materials from reflection measurements
Özet
A two-step measurement procedure has been proposed for measurement of complex permittivity of dielectric materials using one-port reflection measurements. In the procedure, as a first step, a graphical method is applied to analyze on the complex reflection-coefficient plane the general pattern of dielectric behavior of the sample. Then, as a second step, optimization algorithms are utilized for retrieving electrical properties of samples. The procedure requires measurement of complex reflection scattering parameters of at least two samples with different lengths. It has been validated by X-band measurements of three polyvinyl chloride samples with lengths 5, 10, and 20 mm.
Atıf için künye
Hasar, U. C., BARROSO, J. J., Kaya, Y., ERTUĞRUL, M., Bute, M., & Catala-Civera, J. M. (2014). Two-step numerical procedure for complex permittivity retrieval of dielectric materials from reflection measurements. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 116(4), 1701–1710. https://doi.org/10.1007/s00339-014-8303-9
BibTeX
@article{hasar2014-200500,
author = {Hasar, Uğur Cem and BARROSO, Joaquim Jose and Kaya, Yunus and ERTUĞRUL, Mehmet and Bute, Musa and Catala-Civera, Jose M.},
title = {Two-step numerical procedure for complex permittivity retrieval of dielectric materials from reflection measurements},
journal = {APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING},
year = {2014},
volume = {116},
number = {4},
pages = {1701--1710},
issn = {0947-8396},
doi = {10.1007/s00339-014-8303-9},
url = {https://akademik.atauni.edu.tr/yayinlar/200500-two-step-numerical-procedure-for-complex-permittivity-retrieval-of-dielectric}
}