Complex Permittivity and Thickness Evaluation of Low-Loss Dielectrics From Uncalibrated Free-Space Time-Domain Measurements
Özet
A free-space time-domain method is proposed to retrieve dielectric constant (epsilon r), conductivity (sigma e), and thickness (d) of metal-backed low-loss dielectric samples using calibration-independent reflected power peak measurements. Its algorithm is validated by numerical calculations and simulations (CST Microwave Studio) using a sine-modulated Gaussian window. A sensitivity analysis is followed to examine its performance considering the dependencies of reflected power peaks with respect to epsilon r and sigma e. Free-space time-domain measurements have been implemented after transforming frequency-domain measurements into time-domain ones to extract epsilon r, sigma e, and d of polypropylene, polyethylene, and polyoxymethylene samples.
Anahtar kelimeler
Atıf için künye
Hasar, U. C., Kaya, Y., Ozturk, H., Izginli, M., Barroso, J. J., Ramahi, O. M., & Ertuğrul, M. (2021). Complex Permittivity and Thickness Evaluation of Low-Loss Dielectrics From Uncalibrated Free-Space Time-Domain Measurements. IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING, 60. https://doi.org/10.1109/tgrs.2021.3090712
BibTeX
@article{hasar2021-200497,
author = {Hasar, Uğur Cem and Kaya, Yunus and Ozturk, Hamdullah and Izginli, Mucahit and Barroso, Joaquim Jose and Ramahi, Omar M. and Ertuğrul, Mehmet},
title = {Complex Permittivity and Thickness Evaluation of Low-Loss Dielectrics From Uncalibrated Free-Space Time-Domain Measurements},
journal = {IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING},
year = {2021},
volume = {60},
issn = {0196-2892},
doi = {10.1109/tgrs.2021.3090712},
url = {https://akademik.atauni.edu.tr/yayinlar/200497-complex-permittivity-and-thickness-evaluation-of-low-loss-dielectrics-from}
}