Parameter Retrieval of Samples on a Substrate From Reflection-Only Waveguide Measurements

HASAR, UĞUR CEM; Kaya, Yunus; KAYA, YUNUS; Izginli, Mucahit; ERTUĞRUL, Mehmet

doi:10.1109/lmwc.2020.3046697

Makale Tam Makale Uluslararası 2021

Parameter Retrieval of Samples on a Substrate From Reflection-Only Waveguide Measurements

UĞUR CEM HASAR, Yunus Kaya, YUNUS KAYA, Mucahit Izginli, Mehmet ERTUĞRUL

IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS Cilt 31 · Sayı 3 · ss. 320–323 · 01.03.2021

DOI ile aç

Özet

A microwave method has been proposed for constitutive parameters' extraction of samples on a known substrate. The advantage of this method is that it relies on noniterative reflection-only (air- and metal-backed) scattering (S-) parameters so that it is a good candidate for the characterization of samples when only one-port measurements are available. It is validated by the X-band (8.2-12.4 GHz) waveguide S-parameter measurements. A sensitivity analysis is followed to evaluate and improve the performance of our method.

Anahtar kelimeler

COMPLEX PERMITTIVITY noniterative reflection-only Complex permeability known substrate

Atıf için künye

HASAR, U. C., Kaya, Y., KAYA, Y., Izginli, M., & ERTUĞRUL, M. (2021). Parameter Retrieval of Samples on a Substrate From Reflection-Only Waveguide Measurements. IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 31(3), 320–323. https://doi.org/10.1109/lmwc.2020.3046697

BibTeX

@article{hasar2021-200496,
  author = {HASAR, UĞUR CEM and Kaya, Yunus and KAYA, YUNUS and Izginli, Mucahit and ERTUĞRUL, Mehmet},
  title = {Parameter Retrieval of Samples on a Substrate From Reflection-Only Waveguide Measurements},
  journal = {IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS},
  year = {2021},
  volume = {31},
  number = {3},
  pages = {320--323},
  issn = {1531-1309},
  doi = {10.1109/lmwc.2020.3046697},
  url = {https://akademik.atauni.edu.tr/yayinlar/200496-parameter-retrieval-of-samples-on-a-substrate-from-reflection-only-waveguide}
}