Lightweight Convolutional Neural Networks for FineGrained Semiconductor Defect Recognition: An Empirical Study on Wafer SEM Images

Sağlam, Hilal Kübra; Kılıç, Rabiye

Bildiri Tam Metin Bildiri Uluslararası 2026

Lightweight Convolutional Neural Networks for FineGrained Semiconductor Defect Recognition: An Empirical Study on Wafer SEM Images

1. ULUSLARARASI TÜRK DÜNYASI YAPAY ZEKA VE DİJİTAL DÖNÜŞÜM KONGRESİ ss. 369–371 · Bishkek · 18.05.2026–19.05.2026 · 18.05.2026

Atıf için künye

Sağlam, H. K., & Kılıç, R. (2026). Lightweight Convolutional Neural Networks for FineGrained Semiconductor Defect Recognition: An Empirical Study on Wafer SEM Images. 1. ULUSLARARASI TÜRK DÜNYASI YAPAY ZEKA VE DİJİTAL DÖNÜŞÜM KONGRESİ, Bishkek (ss. 369–371).

BibTeX

@inproceedings{saglam2026-198259,
  author = {Sağlam, Hilal Kübra and Kılıç, Rabiye},
  title = {Lightweight Convolutional Neural Networks for FineGrained Semiconductor Defect Recognition: An Empirical Study on Wafer SEM Images},
  booktitle = {1. ULUSLARARASI TÜRK DÜNYASI YAPAY ZEKA VE DİJİTAL DÖNÜŞÜM KONGRESİ},
  address = {Bishkek},
  year = {2026},
  pages = {369--371},
  url = {https://akademik.atauni.edu.tr/yayinlar/198259-lightweight-convolutional-neural-networks-for-finegrained-semiconductor-defect}
}