Analysis of four-point bending test for Nb, Ta, and V-doped CrYN thin films deposited by closed-field unbalanced magnetron sputtering

Sürdürülebilir Kalkınma Amaçları

• SKA 9: Sanayi, Yenilikçilik ve Altyapı

Atıf için künye

Yaylalı, B., Gülten, G., Yeşilyurt, M., Totik, Y., Kulczyk-Malecka, J., Kelly, P., & Efeoğlu, İ. (2025). Analysis of four-point bending test for Nb, Ta, and V-doped CrYN thin films deposited by closed-field unbalanced magnetron sputtering. 51th International Conference on Metallurgical Coatings and Thin Films (ICMCTF 2025), California (ss. 1–3).

@inproceedings{yaylali2025-190882,
  author = {Yaylalı, Banu and Gülten, Gökhan and Yeşilyurt, Mustafa and Totik, Yaşar and Kulczyk-Malecka, Justyna and Kelly, Peter and Efeoğlu, İhsan},
  title = {Analysis of four-point bending test for Nb, Ta, and V-doped CrYN thin films deposited by closed-field unbalanced magnetron sputtering},
  booktitle = {51th International Conference on Metallurgical Coatings and Thin Films (ICMCTF 2025)},
  address = {California},
  year = {2025},
  pages = {1--3},
  url = {https://akademik.atauni.edu.tr/yayinlar/190882-analysis-of-four-point-bending-test-for-nb-ta-and-v-doped-cryn-thin-films}
}