In-Situ X-ray diffraction studies of the structure of nitride thin films under various temperatures

EFEOĞLU, İhsan; Çelik, Ayhan; Arnell, Derek

Bildiri Tam Metin Bildiri Uluslararası 1999

In-Situ X-ray diffraction studies of the structure of nitride thin films under various temperatures

İhsan EFEOĞLU, Ayhan Çelik, Derek Arnell

ICMCTF99, Int. Conf. on Metallurgical Coatings and Thin Films9 ss. 1 · San Diago · 12.04.1999–15.04.1999 · 12.04.1999

Atıf için künye

EFEOĞLU, İ., Çelik, A., & Arnell, D. (1999). In-Situ X-ray diffraction studies of the structure of nitride thin films under various temperatures. ICMCTF99, Int. Conf. on Metallurgical Coatings and Thin Films9, San Diago (ss. 1).

BibTeX

@inproceedings{efeoglu1999-190449,
  author = {EFEOĞLU, İhsan and Çelik, Ayhan and Arnell, Derek},
  title = {In-Situ X-ray diffraction studies of the structure of nitride thin films under various temperatures},
  booktitle = {ICMCTF99, Int. Conf. on Metallurgical Coatings and Thin Films9},
  address = {San Diago},
  year = {1999},
  pages = {1},
  url = {https://akademik.atauni.edu.tr/yayinlar/190449-in-situ-x-ray-diffraction-studies-of-the-structure-of-nitride-thin-films-under}
}