Mission-Based Component Testing for Series Systems
Özet
We consider the component testing problem of a device that is designed to perform a mission consisting of a random sequence of phases with random durations. Testing is done at the component level to attain desired levels of mission reliability at minimum cost. The components fail exponentially where the failure rate depends on the phase of the mission. The reliability structure of the device involves a series connection of nonidentical components with different failure characteristics. The optimal component testing problem is formulated as a semi-infinite linear program. We present an algorithmic procedure to compute optimal test times based on the column generation technique, and illustrate it with numerical examples.
Atıf için künye
Altinel, I. K., Cekyay, B., FEYZİOĞLU, O., Keskin, M. E., & Ozekici, S. (2011). Mission-Based Component Testing for Series Systems. ANNALS OF OPERATIONS RESEARCH, 186(1), 1–22. https://doi.org/10.1007/s10479-010-0816-9
BibTeX
@article{altinel2011-182575,
author = {Altinel, I. Kuban and Cekyay, Bora and FEYZİOĞLU, ORHAN and Keskin, Muhammed Emre and Ozekici, Suleyman},
title = {Mission-Based Component Testing for Series Systems},
journal = {ANNALS OF OPERATIONS RESEARCH},
year = {2011},
volume = {186},
number = {1},
pages = {1--22},
issn = {0254-5330},
doi = {10.1007/s10479-010-0816-9},
url = {https://akademik.atauni.edu.tr/yayinlar/182575-mission-based-component-testing-for-series-systems}
}