Temperature dependence of interface-state density distributions in Cu/ CuO/n-type Si structures
Özet
The interface state densities of Cu/CuO/n-Si Schottky structure were investigated by current-voltage (I-V) and capacitance-voltage (C-V) measurements using Roderick and Card's methods in the temperature range 50-310 K. The interface state density (NSS) as a function of energy distribution (EC-ESS) was extracted from the forward-bias I-V measurements by taking into account the bias dependence of the effective barrier height and series resistance. Furthermore, the values of NSS obtained as a function of temperature. The experimental results have shown that the interface state densities (NSS) value of Cu/ CuO/n-Si Schottky structure decreases with increasing EC-ESS values as a function of temperature. Such behavior of interface state densities (NSS) has been explained with variation of the ideality factor as a function of temperature due to lateral inhomogeneities of the barrier height at the metal-semiconductor interface. (c) 2021 Elsevier Ltd. Selection and peer-review under responsibility of the scientific committee of the International Congress on Semiconductor Materials and Devices, ICSMD2018.
Anahtar kelimeler
Atıf için künye
KARATAŞ, Ş., EJDERHA, K., BAKKALOĞLU, Ö. F., Efeoğlu, H., & Turut, A. M. (2018). Temperature dependence of interface-state density distributions in Cu/ CuO/n-type Si structures. 2nd International Congress on Semiconductor Materials and Devices (ICSMD), Ardahan (ss. 7030–7032). https://doi.org/10.1016/j.matpr.2021.03.285
BibTeX
@inproceedings{karatas2018-180911,
author = {KARATAŞ, ŞÜKRÜ and EJDERHA, KADİR and BAKKALOĞLU, ÖMER FARUK and Efeoğlu, Hasan and Turut, A. Mecit},
title = {Temperature dependence of interface-state density distributions in Cu/ CuO/n-type Si structures},
booktitle = {2nd International Congress on Semiconductor Materials and Devices (ICSMD)},
address = {Ardahan},
year = {2018},
pages = {7030--7032},
doi = {10.1016/j.matpr.2021.03.285},
url = {https://akademik.atauni.edu.tr/yayinlar/180911-temperature-dependence-of-interface-state-density-distributions-in-cu-cuon-type}
}