Bildiri
Özet Bildiri
Uluslararası
2017
The Effect of Post-Annealing on XRD Pattern of DC Sputtered ZnO/SiO2 Structure
8th International Advanced Technologies Symposium (IATS17)
19.10.2017–21.10.2017 · 19.10.2017
Atıf için künye
GÜL, F., & Efeoğlu, H. (2017). The Effect of Post-Annealing on XRD Pattern of DC Sputtered ZnO/SiO2 Structure. 8th International Advanced Technologies Symposium (IATS17).
BibTeX
@inproceedings{gul2017-180905,
author = {GÜL, FATİH and Efeoğlu, Hasan},
title = {The Effect of Post-Annealing on XRD Pattern of DC Sputtered ZnO/SiO2 Structure},
booktitle = {8th International Advanced Technologies Symposium (IATS17)},
year = {2017},
url = {https://akademik.atauni.edu.tr/yayinlar/180905-the-effect-of-post-annealing-on-xrd-pattern-of-dc-sputtered-znosio2-structure}
}