Bildiri
Davetli Konuşmacı
Uluslararası
2018
Memristiv effect on W/Ti/p-Si Structure:Aging Phenımena and One of the origin of Barrier Inhomogeneity
2nd INternational Congress on Semiconductor Materials and Devices
28.09.2018–30.09.2018 · 28.09.2018
Atıf için künye
Efeoğlu, H. (2018). Memristiv effect on W/Ti/p-Si Structure:Aging Phenımena and One of the origin of Barrier Inhomogeneity. 2nd INternational Congress on Semiconductor Materials and Devices.
BibTeX
@inproceedings{efeoglu2018-180896,
author = {Efeoğlu, Hasan},
title = {Memristiv effect on W/Ti/p-Si Structure:Aging Phenımena and One of the origin of Barrier Inhomogeneity},
booktitle = {2nd INternational Congress on Semiconductor Materials and Devices},
year = {2018},
url = {https://akademik.atauni.edu.tr/yayinlar/180896-memristiv-effect-on-wtip-si-structureaging-phenimena-and-one-of-the-origin-of}
}