Characterization of DMS Zn1-xAxO (A: Fe, Ni, Co and Mn, x: 0.01, 0.02, ..., 0.1) grown by ECD method

Güney, Harun; Coskun, Cevdet; Meral, Kadem; İskenderoğlu, Demet

doi:10.1016/j.spmi.2016.04.014

Makale Tam Makale Uluslararası 2016

Characterization of DMS Zn1-xAxO (A: Fe, Ni, Co and Mn, x: 0.01, 0.02, ..., 0.1) grown by ECD method

Harun Güney, Cevdet Coskun, Kadem Meral, Demet İskenderoğlu

SUPERLATTICES AND MICROSTRUCTURES Cilt 94 · ss. 178–186 · 01.06.2016

DOI ile aç

Özet

Zn(1-x)A(x)O (A: Fe, Ni, Co and Mn, x: 0.01, 0.02, . . . , 0.1) films, grown by electrochemical deposition (ECD) on indium tin oxide (ITO) substrate, was characterized by structural, optical, electrical and magnetic techniques. Energy-Dispersive-X-Ray-Fluorescence (EDXRF) spectroscopy showed 5% dopants A. X-ray diffraction (XRD) measurements clearly showed formation of all Zn(0,95)A(0,05)O thin films with a strong c-axis (002) preferential orientation. It was calculated a hexagonal wurtzite structure with XRD results. Absorption measurements of the samples were taken about and an important variation in these measurements were not detected as depend on percentage changes of dopant A. Photoluminescence (PL) measurements showed that PL intensities increase in n-type materials, decrease in p-type materials depending upon increasing doping rate of the grown films. Atomic force microscopy (AFM) pictures of films shows that the most homogeny film is Zn0,95Co0,05O and the most roughness film Zn0,95Mn0,05O. Hall measurements showed that samples doped 5% Fe and Co within ZnO are n-type and other samples doped 5% Ni and Mn within ZnO are p-type. Magnetoresistance (MR) measurements show that all films have feature diluted magnetic semiconductor (DMS) at room temperature. (C) 2016 Elsevier Ltd. All rights reserved.

Anahtar kelimeler

PHOTOLUMINESCENCE Magnetic properties ZnO ZNO THIN-FILMS Electrochemical deposition (ECD) Diluted magbetic semiconductor (DMS) ENERGY ELECTRON-IRRADIATION

Atıf için künye

Güney, H., Coskun, C., Meral, K., & İskenderoğlu, D. (2016). Characterization of DMS Zn1-xAxO (A: Fe, Ni, Co and Mn, x: 0.01, 0.02, ..., 0.1) grown by ECD method. SUPERLATTICES AND MICROSTRUCTURES, 94, 178–186. https://doi.org/10.1016/j.spmi.2016.04.014

BibTeX

@article{guney2016-158844,
  author = {Güney, Harun and Coskun, Cevdet and Meral, Kadem and İskenderoğlu, Demet},
  title = {Characterization of DMS Zn1-xAxO (A: Fe, Ni, Co and Mn, x: 0.01, 0.02, ..., 0.1) grown by ECD method},
  journal = {SUPERLATTICES AND MICROSTRUCTURES},
  year = {2016},
  volume = {94},
  pages = {178--186},
  issn = {0749-6036},
  doi = {10.1016/j.spmi.2016.04.014},
  url = {https://akademik.atauni.edu.tr/yayinlar/158844-characterization-of-dms-zn1-xaxo-a-fe-ni-co-and-mn-x-001-002-01-grown-by-ecd}
}