Article Early Access 2026 · 0 citations

Permittivity Extraction of Electrically Thin Samples by Reflection-Only Free-Space Measurements

Hasar, Ugur C., Xue, Bing, Ozturk, Hamdullah, Kaya, Yunus, Ozturk, Gokhan

Abstract

A permittivity extraction procedure is devised for electrically thin samples from reflection-only free-space measurements. Unlike previous studies, this procedure relies on sample-back metal termination measurements especially useful for thinner samples. An objective function independent of antenna transmission characteristics and reference plane position is derived. Minimum and maximum thickness and permittivity values for which our method is applicable are also examined. Free-space measurements at X-band (8.2-12.4 GHz) of a Rogers 4350B sample (approximate to 1.52 mm) and a FR4 sample (approximate to 1.60 mm) were performed to validate our method with a dielectric constant less than 5% variation.

Keywords

Antenna characteristics free-space frequency-domain metal-back permittivity reflection thin sample COMPLEX PERMITTIVITY

WoS Categories

Engineering, Electrical & Electronic

Citation

Journal: IEEE MICROWAVE AND WIRELESS TECHNOLOGY LETTERS
Year: 2026
ISSN: 2771-957X
eISSN: 2771-9588
DOI: 10.1109/LMWT.2026.3664890
WoS UID: WOS:001708233500001

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