language Türkçe
OH

Ozturk, Hamdullah

13 papers · 154 citations · 2021–2026

Publications
13
Citations
154
Years
5
Publications
Title Year Type Citations
Permittivity Extraction of Electrically Thin Samples by Reflection-Only Free-Space Measurements
IEEE MICROWAVE AND WIRELESS TECHNOLOGY LETTERS
2026 Article 0
Multi-functional, multi-band, low-profile, ultra-thin, and cost-effective metasurface-based polarization converter
MEASUREMENT
2025 Article 7
Honey-Water Content Analysis by Mixing Models Using a Self-Calibrating Microwave Method
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
2023 Article 15
Application of the Kalman Filter/Smoother for accurate material characterization of planar dielectric samples by using free-space measurements at sub-THz
MEASUREMENT
2023 Article 9
Parameter extraction method for reflection-asymmetric bianisotropic metamaterial slabs using one-port measurements
MEASUREMENT
2023 Article 3
Permittivity Extraction of Soil Samples Using Coaxial-Line Measurements by a Simple Calibration
IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING
2023 Article 11
Complex Permittivity and Thickness Evaluation of Low-Loss Dielectrics From Uncalibrated Free-Space Time-Domain Measurements
IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING
2022 Article 35
Improved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurements
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
2022 Article 36
Determination of Propagation Constants and Wave Impedance of Non-Reciprocal Networks From Position-Insensitive Waveguide Measurements
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
2022 Article 9
Coupling analysis between resonating metamaterial slabs using scattering parameters
MEASUREMENT
2021 Article 2
Prediction of water-adulteration within honey by air-line de-embedding waveguide measurements
MEASUREMENT
2021 Article 22
New formalism for characterization of simple non-reciprocal networks free from singularity-point problem
MEASUREMENT
2021 Article 1
Parameter Retrieval of Samples on a Substrate From Reflection-Only Waveguide Measurements
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
2021 Article 4