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Article 2026 · 1 citations

Synthesis and characterization of CoS and CuS microstructures: toward photocatalytic application of CoS/CuS composite materials

Ait-karra, Aziz, Mourak, Abdellah, Zakir, Othmane, Lasri, Mohammed, Almaggoussi, Abdelmajid, Dikici, Burak, Idouhli, Rachid, Abouelfida, Abdesselam, Khadiri, Mohy Eddine, Benzakour, Jaouad

Abstract

In this study, CoS/CuS composite catalysts were easily prepared by mechanically mixing pristine and pure CoS and CuS in different mass ratios to enhance the removal of methylene blue (MB) dye, a model cationic organic pollutant, using a dual approach combining adsorption and photodegradation. Before the preparation and catalytic application of the composites, CoS and CuS materials were separately synthesized via a facile hydrothermal method, using metal chlorides (CoCl2 and CuCl2) and thiourea (SC(NH2)2) as precursors at 140 and 160 degrees C, respectively, for a fixed duration of 16 h. The obtained samples were systematically characterized using X-ray diffraction (XRD), Raman spectroscopy, scanning electron microscopy (SEM) coupled with energy-dispersive X-ray spectroscopy (EDX), X-ray photoelectron spectroscopy (XPS), and Fourier-transform infrared spectroscopy (FTIR) to assess their purity, structural, and morphological properties. Electrical and optical properties were investigated through Hall effect measurements and optical reflectance spectroscopy, revealing distinct behaviors between the two synthesized materials. The study of MB removal by the CoS/CuS composites revealed superior catalytic activity and recycling stability compared to pristine CoS and CuS catalysts, with the highest performance observed for the composite containing 75 and 25% CuS.

Keywords
METHYLENE-BLUE SULFIDE NANOSTRUCTURES SOLVOTHERMAL SYNTHESIS OPTICAL-PROPERTIES RATE CAPABILITY THIN-FILMS ONE-POT TIO2 DEGRADATION COBALT
WoS Categories
Engineering, Electrical & Electronic Materials Science, Multidisciplinary Physics, Applied Physics, Condensed Matter
Citation
Journal
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
Year
2026
Volume
37
Issue
2
ISSN
0957-4522
eISSN
1573-482X
DOI
10.1007/s10854-025-16441-z
WoS UID
WOS:001654845200002
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