Ozakin, O.

Statistical analysis of characteristic parameters of graphene/p-Si junctions prepared under similar conditions

Transfer of graphene thin film obtained by PECVD method to <i>Au/p-Si</i> rectifier junction as interfacial layer and analysis of its barrier characteristics depending on sample temperature

Effects of aging on the electrical properties of Au/n-Si/Ti, Cu/n-Si/Ti and AuCu/n-Si/Ti Schottky diodes