Improved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurements
Hasar, Ugur Cem, Kaya, Yunus, Ozturk, Hamdullah, Izginli, Mucahit, Ertugrul, Mehmet, Barroso, Joaquim Jose, Ramahi, Omar M.
A new deembedding technique is proposed for relative complex permittivity epsilon(r) determination of dielectric materials using gated free-space measurements. Its three main features are 1) it does not require any formal calibration procedure (calibration-free); 2) it is position-insensitive; and 3) it extracts ripple-free epsilon(r) due to gating process. The objective function derived to determine epsilon(r) by the proposed method is validated by free-space measurements of three dielectric samples (polypropylene, polyethylene, and polyoxymethylene). Besides, the accuracy of our method is compared with the accuracy of other calibrationfree and calibration-dependent methods in the literature.
- Dergi
- IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
- Yıl
- 2022
- Cilt
- 71
- ISSN
- 0018-9456
- eISSN
- 1557-9662
- DOI
- 10.1109/TIM.2022.3153991
- WoS UID
- WOS:000770592900011