Article 2021 · 4 atıf

Parameter Retrieval of Samples on a Substrate From Reflection-Only Waveguide Measurements

Hasar, Ugur Cem, Ozturk, Hamdullah, Kaya, Yunus, Izginli, Mucahit, Ertugrul, Mehmet

Özet

A microwave method has been proposed for constitutive parameters' extraction of samples on a known substrate. The advantage of this method is that it relies on noniterative reflection-only (air- and metal-backed) scattering (S-) parameters so that it is a good candidate for the characterization of samples when only one-port measurements are available. It is validated by the X-band (8.2-12.4 GHz) waveguide S-parameter measurements. A sensitivity analysis is followed to evaluate and improve the performance of our method.

Anahtar Kelimeler

Complex permeability complex permittivity known substrate noniterative reflection-only

WoS Kategorileri

Engineering, Electrical & Electronic

Künye

Dergi: IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
Yıl: 2021
Cilt: 31
Sayı: 3
Sayfa: 320-323
ISSN: 1531-1309
eISSN: 1558-1764
DOI: 10.1109/LMWC.2020.3046697
WoS UID: WOS:000629021700024

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