IEEE MICROWAVE AND WIRELESS TECHNOLOGY LETTERS
1 yayın · 0 atıf
Yayınlar
| Başlık | Yıl | Yazar | Atıf |
|---|---|---|---|
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Permittivity Extraction of Electrically Thin Samples by Reflection-Only Free-Space Measurements
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2026 | Hasar, Ugur C., Xue, Bing, Ozturk, Hamdullah +2 | 0 |