Turut, Abdulmecit

Temperature-dependent characteristics of Tantalum and Tantalum nitride based<i> p</i>-Si structures

Experimental current-voltage-temperature and thermal sensitivity behaviors of an ideal Schottky barrier diode over a wide temperature range

Numerical Analysis of Thermal Sensitivity Characteristics by Pinch-Off Model in Inhomogeneous Schottky Barrier Diodes

Self-driven, stable broadband photodetector based on GaAs:CdS heterojunction with ultrahigh on/off ratio and detectivity

Self-powered stable high-performance UV-Vis-NIR broadband photodetector based on PVP-Cobalt@Carbon nanofibers/n-GaAs heterojunction

Current-Voltage Characteristics of Pt Metal-based and PtSi Silicide-based <i>n</i>-Si Schottky Diodes over a Wide Measuring Temperature Range

An experimental study: Dependence of Schottky diode parameters on Schottky contact area size

Thermal sensing capability and current-voltage-temperature characteristics in Pt/<i>n</i>-GaP/Al/Ti Schottky diodes

Analysis and Comparison of the Main Electrical Characteristics of Cu/n-type Si metal semiconductor structures at wide temperature Range

Thermal sensitivity and current-voltage-temperature characteristics in Pt/epitaxy<i> n</i>-Si/<i>n</i><SUP>+</SUP>Si structures as a function of Schottky contact area

Current-voltage-measurement temperature characteristics depending on the barrier-forming contact metal thickness in Au/Cu/<i>n</i>-Si/Au-Sb/Ni rectifying contacts

Discrepancies in barrier heights obtained from current-voltage (<i>IV</i>) and capacitance-voltage (<i>CV</i>) of Au/PNoMPhPPy/n-GaAs structures in wide range of temperature

A highly stable temperature sensor based on Au/Cu/n-Si Schottky barrier diodes dependent on the inner metal thickness

Thermal sensitivity from current-voltage-measurement temperature characteristics in Au/<i>n</i>-GaAs Schottky contacts

2nd international congress on semiconductor materials and devices

Effect of the Al₂O₃ interfacial layer thickness on the measurement temperature-induced I-V characteristics in Au/Ti/Al₂O₃/<i>n</i>-GaAs structures

Temperature dependence of electrical parameters of the Cu/n-Si metal semiconductor Schottky structures